Study some electrical properties of the membranes (Se0.2Te0.8) 2 CuIn and Cu In (Se0.8 Te0.2) 2 thin
Abstract
The resistivity of (Se0.2Te0.8)2 CuIn and CuIn (Se0.8 Te0.2)2 thin films prepared by thermal evaporation in vacuum with a thickness of (2255nm) within the thermal range (300-473K) was measured for the samples as they were deposited. And for the samples that underwent an annealing process at temperatures (373 K) and (473 K) for an hour in the presence of vacuum (10-2Torr).
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